USB Stick Recovery

USB Stick Data Recovery

No Fix - No Fee!

Our experts have extensive experience recovering data from USB Sticks. With 25 years experience in the data recovery industry, we can help you securely recover your data.
USB Stick Recovery

Software Fault £149

2-3 Days

Mechanical Fault£199

2-3 Days

Critical Service £495

1 Day

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Reading Data Recovery — the UK’s No.1 USB Stick Recovery Specialists (25+ years)

We provide professional, engineering-grade recovery for all USB flash drives (USB-A, USB-C, dual/OTG, encrypted, ruggedised) across every brand and failure mode. Our workflow is clone-first, controller-aware, and forensically sound: originals are write-blocked, we capture the fullest possible image, then reconstruct the data layer from the flash translation layer (FTL) up.


Top 30 USB flash-drive brands in the UK (with representative best-selling ranges)

  1. SanDisk — Cruzer Glide/Blade, Ultra Fit/Flair, Extreme PRO, iXpand (Lightning)

  2. Samsung — BAR Plus, FIT Plus, DUO Plus (A+C)

  3. Kingston — DataTraveler DT100/DTSE9/Max, IronKey S1000/D300 (HW-encrypted)

  4. Lexar — JumpDrive S75/S45, F35 Fingerprint

  5. Transcend — JetFlash 790/910/930C (A+C), 820

  6. PNY — Attaché, Turbo, Pro Elite (Type-C)

  7. Corsair — Flash Voyager, Voyager GTX, Survivor (rugged)

  8. ADATA (XPG) — UV128/131/150, UE700 Pro, OTG dual ports

  9. Integral (UK) — Fusion, Neon, Crypto (FIPS)

  10. Verbatim — Store ‘n’ Go, PinStripe, Secure Pro

  11. Patriot — Supersonic Rage 2/Prime/Rage Pro

  12. Silicon Power — Blaze B10/B30, Marvel M70

  13. TeamGroup — C183/C188, M211 (Type-C)

  14. Apacer — AH353/AH360, Armor series

  15. Mushkin — Ventura Ultra/Plus

  16. Intenso — Ultra Line, Speed Line

  17. Emtec — SpeedIN/Click, Tiny USB

  18. Goodram (IRDM) — UME/UCL, IRDM Pro

  19. Netac — U505/U216, Type-C dual

  20. Hikvision — mini USB, encrypted lines

  21. Philips (licensed) — Snow/Vivid

  22. HP (licensed by PNY) — x796w/x765w/x5600C

  23. Toshiba/KIOXIA — TransMemory U301/U365

  24. Sony — USM-M/X (legacy in channel)

  25. iStorage — datAshur/Pro (PIN-authenticated FIPS)

  26. Apricorn — Aegis Secure Key 3NXC (PIN/FIPS)

  27. Sabrent — Nano, Rocket (high-speed)

  28. OWC — Envoy Pro mini (USB/NVMe)

  29. Sandberg — USB-A/C rugged/encrypted

  30. Hama — Mini/Rotate/Type-C dual

We also handle dual-interface OTG (A+C / C+micro-USB), hardware-encrypted (IronKey, datAshur, Apricorn), and high-performance USB-to-NVMe “stick” form factors.


What we recover from (USB media + file systems)

  • Interfaces/links: USB 2.0/3.x/3.2 (BOT & UASP), USB-A/USB-C, Lightning (bridge), Type-A+C dual, micro-USB OTG.

  • Controllers & NAND: Single/dual-channel TLC/QLC, SLC cache, BCH/LDPC ECC, monolith packages (wire-bonded).

  • File systems: exFAT, FAT32, NTFS, HFS+, APFS, EXT, XFS, ReFS, proprietary camera/data-logger layouts.

  • Security: BitLocker-To-Go, IronKey/datAshur/Apricorn hardware crypto, SanDisk SecureAccess/WD Security vaults.


Our professional workflow (USB flash)

  1. Forensic intake → identify controller family/NAND, note symptoms; original media is write-blocked.

  2. Clone first → hardware imaging; unstable media → ISP/monolith pin-out or chip-off NAND acquisition.

  3. Controller-aware reconstruction → rebuild FTL (L2P), ECC (BCH/LDPC), interleave/plane/channel order, XOR/scrambler using PC-3000 Flash, Rusolut VNR, Flash Extractor, custom parsers.

  4. Logical recovery → repair FS, carve content (JPG/RAW/MP4/DB), rebuild MOV/MP4 moov atoms, verify by checksums.

  5. Verification & delivery → SHA-256 manifests, sample-open testing, secure handover.


Top 75 USB stick recovery faults — symptoms & how we fix them

Format: Problem summaryLab resolution (technical)

A. Physical/connector & enclosure (1–12)

  1. Ripped-off USB-A/C connectorMicroscope rework, rebuild VBUS/GND/D±/CC pins, replace fractured pads with micro-jumpers; if inner layers torn, ISP or chip-off to dump NAND directly.

  2. Intermittent contact / wiggling neededReflow connector & ESD arrays, continuity test 90Ω D± differential pair; stabilise then hardware-clone with tight timeouts.

  3. Cracked PCB near connectorEpoxy splint, jumper broken traces (VBUS, D±, ID/CC); if controller lines severed, access NAND via ISP/chip-off.

  4. Bent USB-C shell shorting VBUSReplace shell, verify CC resistors/PD; power through current-limited bench supply to prevent controller damage; proceed to clone.

  5. Loose internal header on metal casingsShim/secure; once link is stable, acquire full image; avoid repeated hot-plug cycles that trigger controller resets.

  6. Mechanical wear of contactsPolish/replace connector; when marginal, read at USB 2.0 BOT to reduce link sensitivity; clone sector-by-sector.

  7. Water ingress (fresh water)Decontaminate, dry, check for galvanic corrosion; if controller unstable, chip-off NAND; reconstruct FTL from dumps.

  8. Salt water / sugary liquidsImmediate decon, corrosion stop; controller often unrecoverable → chip-off, per-die dumps, ECC/XOR/interleave reconstruction.

  9. Thermal damage (heater/radiator)NAND retention loss likely; temperature-assisted reads, multi-sampling, majority voting; rebuild FS.

  10. Crushed drive (vehicle/door)If NAND package intact, chip-off; if cracked die, attempt partial die read under microscope pressure fixtures.

  11. Monolith casing splitExpose test pads (CMD/DAT0..3/CLK/Vcc/VccQ), map pinout; perform ISP (ONFI/Toggle) to dump raw; reconstruct mapping.

  12. Sheared write-protect slider (on adapters)Replace shell; or spoof WP line; then normal imaging.

B. Power/ESD & discrete electronics (13–21)

  1. Shorted TVS diode after surgeReplace/bridge TVS to restore rails; verify LDOs/step-ups; clone immediately under current limit.

  2. Blown 5V to 3.3V regulatorFit compatible LDO; validate ripple & load; clone; if controller also damaged → chip-off.

  3. ESD strike on D+ / D-Replace ESD arrays, re-equalise line impedance; stabilise link and clone; persistent issues → ISP/chip-off.

  4. Over-current from faulty hubBench-power, limit inrush, bypass hub; controller may be damaged → chip-off as needed.

  5. Reverse polarity (modified cables)Electronics often destroyed; inspect for burnt controller; dump NAND chips directly.

  6. Clock crystal failureInject external clock to enum long enough to image; otherwise chip-off.

  7. Brown-outs (weak ports in laptops/cars)Powered hub; force BOT; reduced link speed; clone with conservative timeouts.

  8. Damaged pull-ups/pull-downs on USB linesReplace resistive network; verify enumeration and PID/VID; image once stable.

  9. Hot-plug arcing → intermittent resetsUse captive cable; stabilise VBUS; image with low QD to avoid watchdog resets.

C. Controller firmware/FTL (22–35)

  1. Controller “safe mode” onlyEnter vendor test mode; if mapping accessible, admin-clone namespaces; otherwise chip-off and rebuild L2P from spare metadata.

  2. Firmware reboot loopCapture short stable windows at BOT 1-bit; if not viable, chip-off; ECC/XOR/interleave → virtual device → FS repair.

  3. FTL mapping lossExtract mapping tables (spare area, system blocks); if absent, derive from page headers and temporal order; assemble virtual LBA device.

  4. Wear-levelling table corruptionUse secondary copies; infer from block age counters; rebuild consistent address map before FS work.

  5. SLC cache not flushed (sudden removal)Dump both SLC cache and TLC area; reconcile by newest logical block numbers; repair file-system journal on the clone.

  6. Bad block table (BBT) damagedRebuild BBT using factory markers; remap physical → logical; then continue logical recovery.

  7. XOR/scrambler unknownIdentify via entropy & dictionary for controller family; validate with JPEG/ZIP footers & checksums.

  8. ECC parameters (BCH/LDPC) unknownHeuristics on spare area; tune codeword length & parity; soft-decode LDPC with increased iterations to recover marginal bits.

  9. Channel/plane/interleave unknownCorrelation analysis across dumps; rebuild stripe order; verify by file-level checksum alignment.

  10. Controller lock after host TRIMMetadata-only recovery; carve residual artefacts; communicate hard limits (TRIM is destructive).

  11. Fake-capacity (over-reported) sticksIdentify wrap-around patterns; build corrected virtual capacity; recover valid early-LBA content; warn about overwritten tails.

  12. Controller microcode bug (vendor-specific)Apply lab-known patch flow; dump mapping; clone through stable window; otherwise chip-off path.

  13. OTP/serial mismatch after donor swapTransplant original controller/NVRAM to preserve keys; failing that, chip-off and reconstruct mapping.

  14. U3/SanDisk virtual CD legacy partition interferenceClone full device; mount hidden LUNs separately; repair primary FS after removing virtual partition in the image.

D. NAND cell-level phenomena (36–48)

  1. Retention loss (long-term shelf)Temperature-assisted reads; multi-sample per page; majority voting; LDPC soft-decode.

  2. Read-disturb from heavy readsDistribute read workload; throttle; refresh on the clone only; retry with adjusted thresholds.

  3. Program/erase wear-outPrioritise healthy planes; per-die isolation; accept irrecoverable blocks; reconstruct files with partial segments.

  4. Die/plane partial failureDump healthy dies first; fill holes with carving and redundancy (duplicates/archives).

  5. Pseudo-SLC cache corruptionLocate cache region; prefer freshest data; reconcile duplicates by seq numbers.

  6. Toggle-mode instabilityDrop to ONFI SDR; increase tR; stable long enough to dump raw.

  7. Thermal throttling → timeoutsActive cooling; small queue depth; staged imaging.

  8. Charge leakage after heat exposure (car)Warm-cold cycling during read; majority voting; expect isolated bitflips handled by ECC.

  9. Package delamination (monolith)Re-encapsulate, clamp, ISP reading at reduced frequency; chip-off if necessary.

  10. ECC exhaustion (too many bit errors)Soft-decode LDPC with higher iteration limits; accept residual BER; validate at file level.

  11. Vendor bad-page markers in spare area non-standardCustom parser for spare layout; rebuild correct page images; then FS.

  12. Trimmed but not erased pages (“ghost” data)Harvest pre-erased remnants from free pools; useful for partial recovery after deletion.

  13. Cross-die XOR (striping obfuscation)Detect pattern, undo XOR per die, re-interleave; confirm by container checksums.

E. Logical/file-system & user actions (49–63)

  1. Accidental deletionImage read-only; analyse exFAT/FAT; carve with footer & entropy checks; avoid any writes that trigger FTL GC.

  2. Quick format (exFAT/FAT32/NTFS)Restore prior volume from backup boot sector/superblocks; deep signature sweeps to rebuild tree and extents; validate timestamps/EXIF.

  3. Partition table (MBR/GPT) wipedLocate FS headers; rebuild partitions virtually in the image; mount read-only and export.

  4. “Please format the disk” promptAssume boot region corruption; reconstruct BPB; check allocation bitmap/FAT; recover directory structures.

  5. File copy interruptedReconcile partial writes; recover temp/partial files; repair FS journal on clone.

  6. NTFS $MFT corruption on USBReplay $LogFile; rebuild $Bitmap/indexes; graft orphans; copy out to new media.

  7. exFAT allocation bitmap damagedRegenerate bitmap from dir hints and file sizes; carve gaps; verify against slack space.

  8. HFS+/APFS on USBRebuild Catalog/Extents (HFS+), or OMAP/spacemaps (APFS); enumerate snapshots; export read-only.

  9. EXT/XFS on embedded-use USBBackup superblocks & journal replay on the image; xfs_repair/fsck with controlled options; export data.

  10. Massive fragmentation (4K/8K video)Non-linear extent mapping using GOP cadence/timecodes; rebuild MP4/MOV atoms from mdat.

  11. Corrupt MP4/MOV (moov lost)Recreate stco/co64/stsz/stsc/stts/ctts from mdat; produce playable output; keep original mdat for evidence.

  12. Databases (SQLite/SQL) corruptedWAL/rollback-journal replay on image; salvage coherent pages; export to new container.

  13. Email PST/OST on USB corruptLow-level container repair on clone; extract mailbox to fresh PST with index rebuild.

  14. Malware-hidden files (attributes toggled)Work on image, neutralise malware; unhide, restore attributes; verify integrity.

  15. Cross-platform character/encoding issuesNormalise filenames; repair directory entries; ensure host OS can ingest recovered tree.

F. Security & encryption (64–69)

  1. BitLocker To Go lockedDecrypt on the clone using password/recovery key; then normal FS repair.

  2. IronKey/datAshur/Apricorn (HW crypto) lockedRequires valid PIN/key; decrypt stream during imaging; without creds, cryptography prevents decryption (only plaintext artefact carving possible).

  3. SanDisk SecureAccess/WD Security vault lost passwordRecover only outside-vault plaintext; vault is cryptographically protected without the password.

  4. Enterprise secure USB (FIPS) firmware failureController swap with NVRAM move; if secure element inaccessible, only raw plaintext remnants can be carved.

  5. Password-protected partitions (U3 legacy)Mount hidden LUN post-clone; export accessible content; locked area needs credentials.

  6. Ransomware on USBIdentify strain; known decryptor if available; otherwise restore from unaffected & shadow copies, plus plaintext carving.

G. Host/port/protocol issues (70–75)

  1. Not recognised / Code 43 in WindowsStabilise power & path; force BOT; capture image ignoring OS stack; later FS repair.

  2. macOS reports “cannot repair”Do not write “Fix”; clone with hardware; repair on image; export data.

  3. UASP quirks causing resetsForce BOT; reduce queue depth; long timeouts; capture clean image.

  4. Car head-unit / TV formatted driveProprietary/exFAT variants; clone; identify FS; recover using signature + directory hints.

  5. USB selective suspend/DevSleep issuesDisable power management; bench-power; image continuously to avoid suspend.

  6. Overwritten data (reused after deletion)Overwritten flash pages cannot be reconstructed; we focus on unallocated remnants, duplicates, temp caches, and prior exports—limits documented clearly.


Why Reading Data Recovery?

  • 25 years of successful USB flash recoveries for consumers, businesses, universities, media and forensic matters.

  • Multi-vendor, controller-aware expertise: ISP/monolith pin-outs, chip-off BGA/TSOP, FTL/ECC/XOR reverse-engineering, FS & container repair.

  • Advanced tools & donor inventory (PC-3000 Flash, Rusolut VNR, Flash Extractor, custom decoders) to maximise success.

  • Clone-first, read-only methodology with cryptography-safe handling and evidence-grade reporting on request.

Next step: Place your USB stick in an anti-static bag inside a padded envelope or small box, include your contact details, and post or drop it in.
Contact Reading Data Recovery for a free diagnostic today.

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